Material Technology

เครื่องมือวิเคราะห์ทางกายภาพ Material Technology

SEM_JSM-IT200

JSM-IT200 InTouchScope™ Scanning Electron Microscope

Image
JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation! JEOL InTouchScope™ series, the high performance analytical tool with major three functions.

Specimen Exchange Navi: Guided operation from sample introduction to observation

A step-by-step guide to sample exchange, condition setting and automatic imaging.
Image
Zeromag image displayed on the Main screen

Fast analysis! "Live Analysis"*2

The characteristic X-ray spectrum from the measurement area and the main constituent elements are displayed during observation.
Image

Fast report generation! SMILE VIEW™ Lab: integrated data management

Single-click of the data management button displays the Data management screen, allowing you to generate a report of all images and analysis data, as well as review or re-analyze already-acquired data.
Image
*1 To take a CCD image, optional SNS (stage navigation system) is required.
*2 Applicable to LA (Low Vacuum & Analysis) versions.

Contact us

Syntech Innovation Co., Ltd.
388/5 Nuanchan Road, Nuanchan,
Buengkum, Bangkok 10230

0 2363 8585 (auto)

0 2363 8595

081 498 9939

2092201
Today
Yesterday
This Month
All days
888
1361
14448
2092201

Your IP: 18.207.255.67
2024-10-12 10:34

Link