Advance Analytical

เครื่องมือวิเคราะห์ทางวิทยาศาสตร์ขั้นสูง Advance Analytical

FT-IR model: LUMOS II

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LUMOS II features:

  • Superb FPA imaging performance
  • High-definition spectral and visual data
  • Novel calibrating technology PermaSure+
  • Ultrafast imaging data acquisition:
  • Huge field of view and visual resolution in the sub micrometer range
  • FPA imaging ATR/transmission/reflection
  • Standard TE-MCT detector provides high sensitivity without liquid nitrogen!
  • Software guided measurements support beginners and professional users
  • Easy access to the sample stage:handle samples of up to 40 mm in height
  • Fully motorized and automated hardware
  • Compliant to cGMP/GLP, USP, ChP, JP, Ph. Eur. and FDA 21 CFR p11
  • Automated OQ/PQ/pharmacopeia tests
  • Upgrade your system anytime if your requirements change

Anywhere. Anyone.

We believe that it is high time to make advanced techniques available to every user, regardless of their skill level. The benefits of FT-IR imaging and microscopy are too great to restrict access by cumbersome hard- and software.

We call it true FPA imaging. Why?

Because the LUMOS II elevates FT-IR imaging by making it faster, easier, more accurate and reliable – and even more fun.

To achieve this, we have tailored the LUMOS II, its software and user interface specifically to the user. Beginners get perfect results in no time, while experts are given unlimited access.

Better instrument. Better results.

Naturally, LUMOS II delivers excellent results in transmission and reflection measurements. One notable highlight, however, are the measurements in attenuated total reflection (ATR).

To cut a long story short, its ATR capabilities are unsurpassed. Period. Don‘t settle for unreliable, manual ATR accessories – get the best. Get the LUMOS.

The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.

Effortless FT-IR measurements.

  • Standard TE-MCT detector
  • No liquid nitrogen needed
  • No dry-air purge required
  • Low power consumption
  • Inert to high humidity
    (ZnSe Optics)
  • Long lifetime of components including laser
  • Small footprint
IR-spectroscopic polymer analysis

IR-spectroscopic polymer analysis

The Bruker ALPHA spectrometer is very suitable to verify the correct composition of polymer products and the identification of unknown samples. The intuitive hard- and software design allows even untrained users to perform an analysis.

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Analysis of Contaminations on a Plastic Part using the FT-IR Microscope LUMOS II

Analysis of Contaminations on a Plastic Part using the FT-IR Microscope LUMOS II

FT-IR microscopy is an attractive tool for the analysis of contaminations, since this technique is capable of identifying not only organic but also inorganic components.

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Analysis of Microplastics using FTIR and Raman-Microscopy

Analysis of Microplastics using FTIR and Raman-Microscopy

FT-IR microscopy has established itself as the standard method for the analysis of MPP; it can be applied universally and enables a secure identification of all polymer types. Mapping measurements or FPA imaging allows determining thousands of MPPs in a fully automated manner.

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OPUS/OBJECT: Automated Particle Analysis

OPUS/OBJECT: Automated Particle Analysis

Particle analysis is a key application of FTIR and Raman microscopy and is receiving increased attention since microplastic contamination has become an issue of public interest.

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Contact us

Syntech Innovation Co., Ltd.
388/5 Nuanchan Road, Nuanchan,
Buengkum, Bangkok 10230

0 2363 8585 (auto)

0 2363 8595

081 498 9939

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