Advance Analytical

เครื่องมือวิเคราะห์ทางวิทยาศาสตร์ขั้นสูง Advance Analytical

FT-IR model: LUMOS II

Image

The Anywhere / Anyone FTIR Microscope

Image

We believe that it is high time to make advanced techniques available to every user, regardless of their skill level. The benefits of FT-IR imaging and microscopy are too great to restrict access by cumbersome hard- and software.

From the start the LUMOS II was meant to make FT-IR imaging faster, easier, more accurate and reliable – and even more fun. Of course, this required us to include new and improve upon proven technology.

That's why we tailored the LUMOS II, its software and user interface specifically to the user. Beginners get perfect results in no time, while experts maintain total instrument control.

Superior µ-ATR FT-IR Capabilities

Image

It comes down to this: Better instrument. Better results.

Whether it is transmission, reflection or attenuated total reflectance (ATR), the LUMOS II is always the right choice. But its greatest strength is ATR microscopy enhanced by FPA technology. This makes the LUMOS II a universal tool for failure analysis and product development.

To cut a long story short, its ATR capabilities are unsurpassed. Period. Don‘t settle for unreliable, manual ATR accessories – get the best. Get the LUMOS.

The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.

Innovation in FT-IR Microscopy in Every Fiber

Image

Innovation in FT-IR Microscopy in Every Fiber

Endurance and power for your applications.

For us it is a natural thing to pass on the best technology to our customers. Of course, this also applies to the LUMOS II.

The RockSolidTM interferometer guarantees constant performance, while modern electronics ensure mechanical precision and low energy consumption. Meanwhile, the software monitors instrument effectiveness and always ensures correct functionality.

Better instrument. Better results.

Naturally, LUMOS II delivers excellent results in transmission and reflection measurements. One notable highlight, however, are the measurements in attenuated total reflection (ATR).

To cut a long story short, its ATR capabilities are unsurpassed. Period. Don‘t settle for unreliable, manual ATR accessories – get the best. Get the LUMOS.

The retractable crystal is controlled by high precision piezoelectrical motors and integrated into the lens. This allows you to enjoy a clear view of the sample while your measurement still takes place exactly where you want it.

Effortless FT-IR measurements.

  • Standard TE-MCT detector
  • No liquid nitrogen needed
  • No dry-air purge required
  • Low power consumption
  • Inert to high humidity
    (ZnSe Optics)
  • Long lifetime of components including laser
  • Small footprint

LUMOS II technical features:

  • Standard TE-MCT detector
  • Plug & Play: no liquid nitrogen, no dry-air purge
  • Optional FPA-imaging detector
  • Novel PermaSure+ calibration technology
  • Fully motorized and automated hardware
  • Accomodates samples of up to 40 mm in height
  • Long lifetime of components including laser
  • Inert to high humidity (ZnSe Optics)
  • Stand-alone design, small footprint
  • Low power consumption

LUMOS II provides:

  • Ease-of-use by software guided measurements
  • High-definition spectral and visual data
  • High IR sensitivity without liquid nitrogen
  • Visual resolution in the sub micrometer range
  • Ultrafast FPA imaging performance
  • FPA imaging ATR/transmission/reflection
  • Easy access to the sample stage
  • Compliance to cGMP and FDA 21 CFR p11
  • Automated OQ/PQ/pharmacopeia tests
  • Anytime upgradeability

Applications

  • Failure analysis
  • Particle & surface analysis
  • Industrial manufacturing
  • Forensical science
  • Life science
  • Polymers & plastics
  • Environmental science
  • Pharmaceuticals
IR-spectroscopic polymer analysis

IR-spectroscopic polymer analysis

The Bruker ALPHA spectrometer is very suitable to verify the correct composition of polymer products and the identification of unknown samples. The intuitive hard- and software design allows even untrained users to perform an analysis.

Download

Analysis of Contaminations on a Plastic Part using the FT-IR Microscope LUMOS II

Analysis of Contaminations on a Plastic Part using the FT-IR Microscope LUMOS II

FT-IR microscopy is an attractive tool for the analysis of contaminations, since this technique is capable of identifying not only organic but also inorganic components.

Download

Analysis of Microplastics using FTIR and Raman-Microscopy

Analysis of Microplastics using FTIR and Raman-Microscopy

FT-IR microscopy has established itself as the standard method for the analysis of MPP; it can be applied universally and enables a secure identification of all polymer types. Mapping measurements or FPA imaging allows determining thousands of MPPs in a fully automated manner.

Download

OPUS/OBJECT: Automated Particle Analysis

OPUS/OBJECT: Automated Particle Analysis

Particle analysis is a key application of FTIR and Raman microscopy and is receiving increased attention since microplastic contamination has become an issue of public interest.

Download

Contact us

Syntech Innovation Co., Ltd.
388/5 Nuanchan Road, Nuanchan,
Buengkum, Bangkok 10230

0 2363 8585 (auto)

0 2363 8595

081 498 9939

2283720
Today
Yesterday
This Month
All days
597
649
9268
2283720

Your IP: 3.142.198.219
2025-03-14 17:24

Link