Micro-XRF

  Micro X-ray Fluorescence Spectrometry (Micro-XRF)

        Micro X-ray fluorescence spectrometry (Micro-XRF) provides highest spatial resolution with spot sizes down to 25 µm. The fields of application comprise analyses of art objects, jewelry (M1 ORA), bulk materials and metallic coatings (M1 MISTRAL, M2 BLIZZARD), and high speed “on the fly” measurements of any kind of sample (M4 TORNADO).

 

                                                  

                                                         M1 ORA                                                     M1 MISTRAL

                                                  

                                                      M2 BLIZZARD                                              M4 TORNADO

 

 

 

 

 

 



M1 ORA 

Small Tabletop Micro-XRF Spectrometer




       Designed for Jewelry Analysis in Narrow Space Situations

       The M1 ORA is the ideal instrument for non-destructive analysis of jewelry, precious metals or coins – especially in situations where space is limited. Ease-of-use, a small footprint and rugged design combined with excellent analytical results are its main features.

       Persons who have received only introductory training – for instance personnel in a jewelry shop – will be able to generate reliable information on precious metal content within minutes.

        Analyzing Jewelry

       Micro-X-ray fluorescence with the M1 ORA or the M1 MISTRAL is a very good option for the analysis of jewelry samples. Non-destructivity leaves the sample unharmed, simultaneous detection of all elements allows a complete characterization of the material and the small spot size permits the analysis of irregular and inhomogeneous samples.

       The achieved accuracy is not as high as with fire assay, but it is sufficient for quality control of jewelry manufacturing, screening of unknown samples and detection of traces down to the ppm-range.




 


 

       M1 MISTRAL
      Compact Tabletop Micro-XRF Spectrometer

       Designed for the Analysis of Bulk Materials and Coatings

       The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.

       The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.

       The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.


     Finding Traces of Other Metals in Gold

       To distinguish the purity of gold is crucial in precious metals analysis. In particular the separation between 99.5 wt.% and 99.9 wt.% is important for different applications: the effort in refining gold to the higher purity is bigger although the material value is not that different. For economic reasons it can therefore be important to know which caratage is at hand.

       The measurements with the M1 MISTRAL show that it is possible to distinguish between 99.5 wt.% and 99.9 wt.% Au. The peaks of traces can be easily detected and used for quantification. The measured samples have concentrations of approx. 0.5 wt.% and 0.1 wt.% Ag, respectively. Other trace elements (for example Cu, Ni, Zn, Pd) have even a better limit of detection due to their higher excitation efficiency.

       The example shows, that it is possible to identify and quantify elements with a concentration lower than 0.04 % to 0.01 %. The intensity and the peak-to-background ratio of these peaks are large enough to detect with the M1 MISTRAL.
 

 

 

 

 

      M2 BLIZZARD
      Slotted Tabletop Micro-XRF Spectrometer

       Bruker‘s M2 BLIZZARD is a Micro-X-ray fluorescence spectrometer for the nondestructive analysis of material compositions and multi-layer coating thickness, in accordance with ASTM B568 and DIN/ISO 3497. The slotted instrument design is ideal for flat and oversized samples, i.e. large printed circuit boards. The instrument is controlled by the all new, state-of-the art XSpect Pro software.

       A perfect solution for PCB analysis
       Key features:

ƒ       - Slotted configuration with extendable“super-sized” sample stage
ƒƒ       - Slot gap 20 mm
ƒ       - Large and highly durable sample tray for sample positioningƒƒfor sample positioning
ƒƒ       - All-new XSpect Pro software
ƒƒ       - All-new XData software for method and reference standards management
ƒƒ       - Configurable measurement user interface and results display
ƒƒ       - Spectra auto save for post-measurement results reprocessing and archiving
ƒ       - User-defined tolerance for easy PASS/FAIL determination
ƒƒ       - “Peak-Finder” for qualitative analysis of unknowns
       - Standard measurement report included
ƒƒ       - Optional, industrial-strength foot switch for measurement START/STOP
ƒƒ       - Optional, fully configurable SPC features for your process
ƒƒ       - Clean and simple instrument to PC interface – one single USB cable.

  

 

 

 


        M4 TORNADO

       2D Micro-XRF with Ultimate Speed and Accuracy


       The Instrument of Choice for Highly Sensitive and Non-Destructive Element Analysis

      The M4 TORNADO is the tool for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) analysis. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples, whether small or large, even or irregularly shaped and generates a wealth of information on composition and element distribution.

       Equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic and even of liquid sample. Providing spot sizes down to 25 µm (for Mo Kα radiation), excellent spatial resolution is warranted.

       The proven ESPRIT analysis software provides a flexible measurement setup and a variety of evaluation and processing tools. A large vacuum sample chamber supports light element detection.

       The instrument can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.

 

       Distribution Analysis of Electronic Components

       As a fast, non-destructive and sensitive analytical method, Micro-XRF is well suited to examine electronic components. The M4 TORNADO provides important information on the elemental composition and can be used for:

       •      the determination of the distribution of several elements

       •      the control of RoHS elements and the compliance for every component

       •      the quantification of specific areas of the sample for coating thickness determination or for the compositional analysis of special components

       •      the non-destructive examination of ICs by measuring the high energetic fluorescence radiation

M4 TORNADO's feature HyperMap offers the possibility to sum spectra over larger, arbitrarily definable areas, providing excellent statistics for quantification.

 




 

Analyzing Geological Samples

Elemental distribution analysis on geological samples

Distribution of single elements calculated from the HyperMap at 200 ms/pixel acquisition time.

 

       The analysis of geological samples with Micro-XRF offers a wide variety of information on structure and composition of a specimen. This includes the distribution of elements, the identification and analysis of single grains and the execution of line scans. The high count rate capability and the excellent detector performance of the M4 TORNADO permit reliable data collection within a very short measurement time. The TurboSpeed stage allows very fast mapping and a measurement "on the fly".

       Even very short acquisition times in the low millisecond range can already deliver first impressions of a material's structure. Longer measurement times ensure better spatial resolution due to better statistics and an enhanced contrast between pixels. A longer measurement time also offers the possibility to examine traces.

 

 

 

Analysis of geological thin sections

 Distribution of the main components in the thin sections. Each color represents an individual element.
 

       Micro X-ray fluorescence (Micro-XRF) analysis uses direct excitation of the sample with focused X-rays. This allows the combination of micrometer-scaled spatial resolution of a polycapillary lens with the trace element sensitivity of XRF, where the detection limits for most elements are a few tens to hundreds of ppm. No additional sample preparation is required for Micro-XRF. The high speed of the data acquisition and evaluation allows scanning multiple thin sections in less than one hour.

       The M4 TORNADO is used in petrology for a quick compositional pre-screening of thin sections and for the digitalization of thin sections before optical or electron microscope studies. Large scan areas of up to 170 x 140 mm² allow to analyze up to 18 thin sections in a single run. The M4 TORNADO software supports comprehensive data presentation and evaluation. The visualization of the chemical map and the selection of areas of interest enable advanced post processing of the HyperMap data as phase analysis for fast identific on of elements and mineral phases, quantitative analysis and the finding of trace elements.